Date of Award

8-31-2026

Document Type

Open Access Thesis

Degree Name

Master of Science (MS)

Department

Physics, Applied

First Advisor

Dr. Walter Buchwald

Second Advisor

Dr. Matthew Bell

Third Advisor

Dr. Jonathan Celli

Abstract

This thesis presents the Sliding Aperture Transform (SLAPt), a novel mathematical technique for extracting exponential argument and pre-factor  from experimental data. The method transforms measured waveforms into an inverse-domain representation where exponential decay processes appear as distinct peaks, simplifying data analysis and reducing the effects of baseline offsets and noise. The technique is here applied to time dependent capacitance transients associated with irradiated and non-irradiated silicon pn junction diodes. The technique is further developed and applied to positive argument exponentials using an axillary function. This allows forward bias  current-voltage measurements, and forward pulse-bias current transient measurements to be SLAP analyzed, extracting diode defect activation energies, saturation current and ideality as well as device minority-carrier lifetime. The results are shown to be consistent with established semiconductor literature and demonstrate the effectiveness of the transform for analyzing complex exponential phenomena. The methodology has potential applications in semiconductor physics, electronic device characterization, and other scientific systems governed by exponential dynamics.

Comments

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